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TRI — Investor Presentation 2021
Nov 26, 2021
52263_rns_2021-11-26_a9dab2eb-194c-4f7c-b127-58d78d8c48da.pdf
Investor Presentation
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德律科技股份有限公司 www.tri.com.tw
Nov. 26, 2021
報告人 : 陳冠元 / 財務長兼代理發言人
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德律科技股份有限公司
-
成立時間 : 1989年4月10日
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創立人 : 陳玠源董事⻑
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資本額 : 新台幣23.62億
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: 主力產品 電路板組裝檢測設備
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自動光學檢測設備 (IT/Image Tester)
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錫膏自動光學影像檢測機 (SPI) 自動光學影像檢測機 (AOI) X-ray 自動檢測機 (AXI)
-
電路板測試機 (BT/In-Circuit Board Tester)
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組裝電路板測試機 (MDA) 全功能電路板自動測試機 (ICT)
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全球唯一 “ 一條龍 ” 電路板組裝檢測設備廠 德律產品在客戶的電路板組裝產線的應用
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: 整合多項視覺核心新技術因應 - 高精密電子料件量測需求 - 先進半導體製程 / 封裝檢測需求
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Calibration 校正技術 雷射 (Laser)
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條紋光
(Fringe
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深度對焦
(DFF)
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TRI AOI Metrology 量測 Linear 共線性
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Linearity
主要競爭對手
: 韓國 Koh Young 日本: Omron 中國大陸: Jutze/Sinic-Tek/Holly 馬來西亞: Vitrox 美國: Keysight/Teradyne 德國: Viscom/SPEA
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全球銷售服務網
More than 3000 customers have been serviced through worldwide partners More than 50 distributors and Rep. worldwide.
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More than 50 distributors and Rep. worldwide. 主要客戶為全球各
大電子產品組裝廠
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Electronic Industry/Revenue Movement
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5
8 Industrial/Defense
15
18
Automobile
11
12 Household/Game
16
13
Phone/Peripheral
15
12
Network
26
26 NB/Tablet/Peripheral
Semiconductor/IC
12
10
202001-202010 202101-202110
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10000
年營收
台幣百萬
-
9000 Uncertainty of global economy
-Delay of 3D AOI launch
-Low price competition in China
8000
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Economic
Increase of smart
Decline of PC/NB
mobile devices
recovery
7000 application application -
Blue-ocean
Rush capacity 5870
6000 buy triggered by
economic recovery 5388
4919 4951
5000 4754
4387
New FCT
New AOI 7500
4084
+7500/L/D
is not launched 37783894
4000 T
until ’06. 3601
New 7500
Economic
+7006L 3100
New SPI recession
3000 7006
2541
+7100EP
2055 2074
2000 New AOI 1706
7100 15531470
1000 569 [777] [902]
0
'01 '02 '03 '04 '05 '06 '07 '08 '09 '10 '11 '12 '13 '14 '15 '16 '17 '18 '19 '20
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每股盈餘
7
6.43
6
5.34
4.87
5 4.67 [5.03]
4.48
4.51 4.63
4.23
4.45
4 3.97
3.41
3.19
3
2.53
2.17 2.52
2
1.82
1 1.02
0
'03 '04 '05 '06 '07 '08 '09 '10 '11 '12 '13 '14 '15 '16 '17 '18 '19 '20
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紅海與藍海市場營收變化
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台幣百萬
藍海 紅海 毛利率
8,000 80%
紅海市場 : 藍海市場之產品與應用 :
- -
較低技術門檻 3D AOI
7,000
- -
價格導向 高精密電子料件量測
70%
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先進半導體製程檢測需求
6,000
-
AXI
-
電路板測試機
5,000 54%
60%
57%
55% 55% (~Q3)
4,000 53% 53% 53%
1,689
1,453
1,578
1,856
3,123 50%
3,000 46%
1,592
1,517
4,955
2,000
3,063 3,262 1,356
2,934 40%
(62%) (66%) (71%)
2,009 (67%)
1,000 1,631 1,583
914 (34%) (51%) (56%)
(16%)
0 30%
2014 2015 2016 2017 2018 2019 2020 2021.10
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TRI 3D AOI Product Roadmap
SMT 元件
0201 >> 15 um
01005 >> 10 um
Mini LED 應用
2D TR7700 SIII Plus @ 5.5 um
3D TR7700QE-S @ 5.5 / 3.45 um
系統封裝 (SiP)/
+ Laser @ 10/20 um
填充膠 (Underfill)
晶圓 (Wafer)
(TR7700QE-S +IR)
@ 3.45 um TR7960A (DFF)
黏晶 (Die Bond)
+ Laser @ 10/20 um
檢測
打線 (Wire Bond)
+ DFF @ 1.0 / 0.5 um
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TRI 3D AOI Product Roadmap
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TR7700QB SII
TR7700Q(L) SII (DL)
-12M/15um
-12M/15um
TR7500QE Plus
-12M/12um
-12M/10, 15um
-12M/10um + 4 Sideview
-12M/5.5um
TR7700(L) QE -12M/15,10um
TR7700QM SII -12M/5.5um
TR7500(L) QE -12M/15,10um+4 Sideview
•
TR7700 QE-S -12M/5.5um,3.45um AOM & AI SW module
•
• 4x DLP + Omni color RGBW lighting Optional Laser module
•
• Optional DFF module
Optional Laser module
•
Optional DFF module
2019 2020 2021 2022
13 Confidential
Speed
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NEW
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TR7700Q SII 3D AOI 特點
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Industry-Leading Inspection Speed up to 57 cm[2] /sec
Ease of Programming with TRI’s Smart Library Multiple 3D Technologies: Zero-escapes Inspection
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14
Confidential
升級 DFF 3D 科技 Only available for TR7700Q
Optimal focus position Clearer 2D Images
0.5 µm 1 µm 超高解析度
Sharper images Shadow-free 3D Image
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Semiconductor - 打線接合 (Wire bond)
SMT – 錫點 (Solder joint)
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TR7700QE-S 3D AOI 特點
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Supports 3.45 / 5.5um Ultra High Resolution
: 可支援半導體封裝等級檢測應用
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貼片元件 (SMD)
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填充膠 (Underfill)
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16
Confidential
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TRI’s SPI 最新應用項目
Fast Inspection Precision Smart
Speed Inspection Factory
5.5
μm
Large FOV High Resolution Closed Loop
CoaXpress Technology Shadow Free IPC-CFX
Dynamic Imaging Smart Warpage Technology Smart Library
Stop & Go Imaging High Inspection Range YMS 4.0
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Confidential
TR7007D/Q Plus Series SPI 新應用特點 Improved Inspection Stability and Capability
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Enhanced 2D Light Improved Imaging Easy Maintenance
Full Size Support Pin (Optional)
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New Log Interface
Easy hardware Upgrading design
NEW Motion Controller
完備的3D在線型 AXI
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TR7600(LL/TL) SIII
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TR7600F3D(LL) SII
TRI新一代具指標性的在線型 PCBA檢測解決方案。結合了業界 最快速的高解析取像速度,並在先 進的自動X光檢測中大大提升了影 像品質。
大幅提升檢測速度的高解析度 在線型3D AXI,並可應用CT 電腦斷層掃描科技,專門用於 檢測需要高影像品質的組裝電 路板和軟板組件。
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- 電路板測試機 多核心配置
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TR5001 SII Quad-code System 單核心與多核心測試時間比較
10
101.1%
100.2%
100%
9
TR5001 SII Single-Core TR5001 SII Dual-Core TR5001 SII Quad-Core
(100.0%) (100.2%) (101.1%)
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高密度測試點數ICT TR8100H SII / TR8100HL SII
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NEW
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Original Test Points. New SII Model Model TR8100LV 3584 pins 7056 pins ~~SII~~ TR8100LLV 5632 pins 11088 pins Confidential 21
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TRI 整合完整的解決方案
Metrology
Multi-Sensing
AOM
2D/3D
AOI & AVI
Industry 4.0
Hermes/CFX
TRI
SECS/GEM AI
AOI
22
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全新TRI量測功能(AOM)
UI: New designed and friendly user interface
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Features: More complete 量測元素
measurement functions will be
構造方法
available
量測目標
指定座標系
High Flexibility: Multi-Layer
measurements
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23
TRI的AI應用
缺陷檢測/ 字元識別/ 視覺檢測/ 量測輔助 檢測階段AI 優點:提高檢測品質,減少誤判 維修站缺陷分類和複檢 複判階段 優點:減少人工複檢的工作量 AOI SPI AXI TRI 檢測解決方案 TRI AI 工作站 維修 / 複判站
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TRI的AI應用
1. AI 智慧編程 (Smart Programing)
-
2. AI 工作站 : 伺服器 終端架構的 AI 檢測及調試
3. AI 智能複判主機 (Verify Host): AI 維修/複判站(Repair Station) 管理
4. AI : 檢測
-
字元辨識 (OCV/OCR)
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瑕疵檢測
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待測物外觀檢測
-
異物檢測
TRI AI 發展歷程及規劃藍圖
AI 發展藍圖:
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短期 中期 ⻑期
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快速發展
-
取得商用化元件資料庫
-
外部合作單位
技術紮根
無人化 AOI應用
採用開源 (Open-source) 方案 零漏測及零誤判 推論/訓練伺服器 TRI 規格/標準訂定 發展更快速及更精確檢測方案
AI 應用:
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♦ AI 維修/複判站 ♦ AI 外觀檢測 ♦ 檢測一致性優化
♦ AI 異物檢測 ♦ IC 腳位浮高檢測 ♦ 智慧編程
♦ AI 字元辨識 ♦ AI 控制優化 ♦ 客戶端有效訓練
♦ AI打線接合檢測
2019 2020 2021~
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TRI YMS 4.0 良率管理系統 協助客戶提升生產力及品質管理
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-
實時狀態檢查
-
監控生產問題改善狀況
-
SPC和生產力監控 • PDCA改善循環
-
•
-
列出排名前10的不良項目和對應圖像 支持品質優化
-
依各站別, 線別, 流程找出問題點
-
輸出報告到MES / SFCS
工業4.0解決方案
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Confidential
TRI支援封閉迴路控制系統 TRI SPI, AOI, AXI 檢測資訊的串流 IPC CFX(data)/HERMES(M2M)
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Data & I Ski b d
mage p oar
Feedback Feedforward
Feedback data
Pre-reflow Post-reflow
SPI AXI
AOI AOI
TR7007QI TR7600 SIII
TR7710 TR7700QE
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智慧工廠解決方案
Big Data Ready
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Smart Monitoring
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內部研發團隊
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. •PLC control
•Optical Dept. • system S/W
• Mechanical Dept. YMS, R/S
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•Lighting control
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光學檢測
200 [+] RD
電路板測試
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外部機構技術支援
Department of Computer science, 台灣大學 - 影像處理 / Understanding
Department of Power Mechanical, 清華大學
-
X-ray 3D Reconstruction/Digital Tomosynsis Algorithm/ 電腦切層演算法
-
Center of Measurement Standards, 工研院 - Length/ Camera / 色彩校正
近年獲獎
2016 Global Technology Award 2017 Circuits Assembly NPI Award 2017 EM Asia 創新獎 2018 Circuits Assembly NPI Award 2018 EM Asia 最佳供應商獎 2019 Global Technology Award 2019 EM Asia 傑出產品獎 2020 Global Technology Award 2021 EM Asia 創新獎
-
TRI’s Company Milestones: - - -
-
https://www.tri.com.tw/tw/about/about 21 1 2.html
免責聲明
本簡報資料所提供之資訊,包含所有前瞻性的 看法,德律科技股份有限公司(本公司)將不 會因任何新的資訊、未來事件、或任何狀況的 產生而負有更新或修正本簡報資料內容之責 任。本簡報資料中所提供之資訊並未明示或暗 示的表達或保證其具有正確性、完整性、或可 靠性,亦不代表本公司、產業狀況或後續重大 發展的完整論述。
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Better Testing Better Quality
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THANK YOU! For more information about Test Research, Inc. Please visit: www.tri.com.tw
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