Tera Probe,Inc. Logo

Tera Probe,Inc.

Specialized provider of semiconductor testing, including wafer and final testing.

6627 | T

Overview

Corporate Details

ISIN(s):
JP3546550009
LEI:
Country:
Japan
Address:
横浜市港北区新横浜二丁目7番17号

Description

Tera Probe, Inc. is a specialized provider of semiconductor testing services. The company offers comprehensive test solutions for the semiconductor manufacturing process, with a primary focus on wafer testing and final testing of integrated circuits. In addition to test operations, Tera Probe engages in the development of testing technologies and programs to ensure product quality and reliability for its clients.

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Date Filing Language Size Actions
2025-08-14 08:33
確認書
Japanese 8.8 KB
2025-08-14 08:32
半期報告書-第21期(2025/01/01-2025/12/31)
Japanese 211.0 KB
2025-03-28 01:14
臨時報告書
Japanese 23.3 KB
2025-03-27 07:32
内部統制報告書-第20期(2024/01/01-2024/12/31)
Japanese 23.5 KB
2025-03-27 07:31
確認書
Japanese 8.7 KB
2025-03-27 07:31
有価証券報告書-第20期(2024/01/01-2024/12/31)
Japanese 1.1 MB
2024-08-14 08:05
確認書
Japanese 8.8 KB
2024-08-14 08:04
半期報告書-第20期(2024/01/01-2024/12/31)
Japanese 209.6 KB
2024-05-14 08:03
確認書
Japanese 8.9 KB
2024-05-14 08:03
四半期報告書-第20期第1四半期(2024/01/01-2024/03/31)
Japanese 160.8 KB
2024-03-29 01:08
臨時報告書
Japanese 23.4 KB
2024-03-28 07:05
内部統制報告書-第19期(2023/01/01-2023/12/31)
Japanese 23.6 KB
2024-03-28 07:04
確認書
Japanese 8.8 KB
2024-03-28 07:03
有価証券報告書-第19期(2023/01/01-2023/12/31)
Japanese 1.1 MB
2023-11-10 07:03
確認書
Japanese 8.8 KB

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Insider Transactions

Date Insider Name Position Type Shares Value
No insider transactions recorded for this company.

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